A Fault Modeling Technique to Test Memory BIST Algorithms.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/VenkateshKPS02
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/VenkateshKPS02
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Joji_Philip
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Raja_Venkatesh
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sailesh_Kumar
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sunil_Shukla
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FMTDT.2002.1029771
>
foaf:
homepage
<
https://doi.org/10.1109/MTDT.2002.1029771
>
dc:
identifier
DBLP conf/mtdt/VenkateshKPS02
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FMTDT.2002.1029771
(xsd:string)
dcterms:
issued
2002
(xsd:gYear)
rdfs:
label
A Fault Modeling Technique to Test Memory BIST Algorithms.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Joji_Philip
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Raja_Venkatesh
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sailesh_Kumar
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sunil_Shukla
>
swrc:
pages
109-116
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/2002
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/mtdt/VenkateshKPS02/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/mtdt/VenkateshKPS02
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/mtdt/mtdt2002.html#VenkateshKPS02
>
rdfs:
seeAlso
<
https://doi.org/10.1109/MTDT.2002.1029771
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/mtdt
>
dc:
title
A Fault Modeling Technique to Test Memory BIST Algorithms.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document