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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/WangMCD06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Francky_Catthoor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hua_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Miguel_Miranda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wim_Dehaene>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMTDT.2006.23>
foaf:homepage <https://doi.org/10.1109/MTDT.2006.23>
dc:identifier DBLP conf/mtdt/WangMCD06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMTDT.2006.23 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label On the Combined Impact of Soft and Medium Gate Oxide Breakdown and Process Variability on the Parametric Figures of SRAM components. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Francky_Catthoor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hua_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Miguel_Miranda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wim_Dehaene>
swrc:pages 71-76 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mtdt/WangMCD06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mtdt/WangMCD06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mtdt/mtdt2006.html#WangMCD06>
rdfs:seeAlso <https://doi.org/10.1109/MTDT.2006.23>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mtdt>
dc:title On the Combined Impact of Soft and Medium Gate Oxide Breakdown and Process Variability on the Parametric Figures of SRAM components. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document