[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/WangYI03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Baosheng_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Josh_Yang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMTDT.2003.1222360>
foaf:homepage <https://doi.org/10.1109/MTDT.2003.1222360>
dc:identifier DBLP conf/mtdt/WangYI03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMTDT.2003.1222360 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Reducing Test Time of Embedded SRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Baosheng_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Josh_Yang>
swrc:pages 47-52 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mtdt/WangYI03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mtdt/WangYI03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mtdt/mtdt2003.html#WangYI03>
rdfs:seeAlso <https://doi.org/10.1109/MTDT.2003.1222360>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mtdt>
dc:subject Embedded SRAM test, Inductive Fault Analysis, Test Time, Memory Redundancy, March Test (xsd:string)
dc:title Reducing Test Time of Embedded SRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document