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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/WuCLWLWCHPCK06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-Yen_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chien-Wei_Liao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Yuan_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chin-Hsing_Kao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hann-Ping_Hwang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Houng-Chi_Wei>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hua-Ching_Chien>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jia-Lin_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saysamone_Pittikoun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shih-Hsien_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Travis_Cho>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMTDT.2006.8>
foaf:homepage <https://doi.org/10.1109/MTDT.2006.8>
dc:identifier DBLP conf/mtdt/WuCLWLWCHPCK06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMTDT.2006.8 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-Yen_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chien-Wei_Liao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Yuan_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chin-Hsing_Kao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hann-Ping_Hwang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Houng-Chi_Wei>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hua-Ching_Chien>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jia-Lin_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saysamone_Pittikoun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shih-Hsien_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Travis_Cho>
swrc:pages 80-84 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mtdt/WuCLWLWCHPCK06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mtdt/WuCLWLWCHPCK06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mtdt/mtdt2006.html#WuCLWLWCHPCK06>
rdfs:seeAlso <https://doi.org/10.1109/MTDT.2006.8>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mtdt>
dc:title Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document