A systematic approach to reducing semiconductor memory test time in mass production.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/YehKWHC05
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/YehKWHC05
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Chao-Hsun_Chen
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Chih-Tsun_Huang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jen-Chieh_Yeh
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shyr-Fen_Kuo
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FMTDT.2005.15
>
foaf:
homepage
<
https://doi.org/10.1109/MTDT.2005.15
>
dc:
identifier
DBLP conf/mtdt/YehKWHC05
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FMTDT.2005.15
(xsd:string)
dcterms:
issued
2005
(xsd:gYear)
rdfs:
label
A systematic approach to reducing semiconductor memory test time in mass production.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Chao-Hsun_Chen
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Chih-Tsun_Huang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jen-Chieh_Yeh
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shyr-Fen_Kuo
>
swrc:
pages
97-102
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/2005
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/mtdt/YehKWHC05/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/mtdt/YehKWHC05
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/mtdt/mtdt2005.html#YehKWHC05
>
rdfs:
seeAlso
<
https://doi.org/10.1109/MTDT.2005.15
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/mtdt
>
dc:
title
A systematic approach to reducing semiconductor memory test time in mass production.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document