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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mvhi/PiG10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Da-neng_Pi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hai-zhou_Gao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMVHI.2010.62>
foaf:homepage <https://doi.org/10.1109/MVHI.2010.62>
dc:identifier DBLP conf/mvhi/PiG10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMVHI.2010.62 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Design of Test System on Zero Sequence Current Transformers. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Da-neng_Pi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hai-zhou_Gao>
swrc:pages 626-629 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mvhi/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mvhi/PiG10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mvhi/PiG10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mvhi/mvhi2010.html#PiG10>
rdfs:seeAlso <https://doi.org/10.1109/MVHI.2010.62>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mvhi>
dc:subject zero sequence current transformer, leakage protection, microcontroller, test system (xsd:string)
dc:title Design of Test System on Zero Sequence Current Transformers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document