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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mwscas/VajralaADLA23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhinav_Vajrala>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arnab_Dey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dheekshith_Akula>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Khanh_M._Le>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zia_Abbas>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMWSCAS57524.2023.10406027>
foaf:homepage <https://doi.org/10.1109/MWSCAS57524.2023.10406027>
dc:identifier DBLP conf/mwscas/VajralaADLA23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMWSCAS57524.2023.10406027 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label A 250pA, Gate-Leakage Based Trimming Free Current Reference, from -55¬įC to 150¬įC for Lower Power IoT Applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhinav_Vajrala>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arnab_Dey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dheekshith_Akula>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Khanh_M._Le>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zia_Abbas>
swrc:pages 152-156 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mwscas/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mwscas/VajralaADLA23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mwscas/VajralaADLA23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mwscas/mwscas2023.html#VajralaADLA23>
rdfs:seeAlso <https://doi.org/10.1109/MWSCAS57524.2023.10406027>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mwscas>
dc:title A 250pA, Gate-Leakage Based Trimming Free Current Reference, from -55¬įC to 150¬įC for Lower Power IoT Applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document