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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/nanoarch/0002CF11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liang_Fang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sorin_Cotofana>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yao_Wang_0002>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FNANOARCH.2011.5941501>
foaf:homepage <https://doi.org/10.1109/NANOARCH.2011.5941501>
dc:identifier DBLP conf/nanoarch/0002CF11 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FNANOARCH.2011.5941501 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label A unified aging model of NBTI and HCI degradation towards lifetime reliability management for nanoscale MOSFET circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liang_Fang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sorin_Cotofana>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yao_Wang_0002>
swrc:pages 175-180 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/nanoarch/2011>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/nanoarch/0002CF11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/nanoarch/0002CF11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/nanoarch/nanoarch2011.html#0002CF11>
rdfs:seeAlso <https://doi.org/10.1109/NANOARCH.2011.5941501>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/nanoarch>
dc:title A unified aging model of NBTI and HCI degradation towards lifetime reliability management for nanoscale MOSFET circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document