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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/nanonet/Sulieman09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mawahib_Hussein_Sulieman>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-642-04850-0%5F33>
foaf:homepage <https://doi.org/10.1007/978-3-642-04850-0_33>
dc:identifier DBLP conf/nanonet/Sulieman09 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-642-04850-0%5F33 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label On the Reliability of Interconnected CMOS Gates Considering MOSFET Threshold-Voltage Variations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mawahib_Hussein_Sulieman>
swrc:pages 251-258 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/nanonet/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/nanonet/Sulieman09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/nanonet/Sulieman09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/nanonet/nanonet2009.html#Sulieman09>
rdfs:seeAlso <https://doi.org/10.1007/978-3-642-04850-0_33>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/nanonet>
dc:subject Reliability; threshold voltage; CMOS; gates (xsd:string)
dc:title On the Reliability of Interconnected CMOS Gates Considering MOSFET Threshold-Voltage Variations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document