AI Powered THz VLSI Testing Technology.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/natw/AkterKSSP20
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Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/natw/AkterKSSP20
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/John_Suarez
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Michael_S._Shur
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mustafa_Karabiyik
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Naznin_Akter
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Nezih_Pala
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FNATW49237.2020.9153077
>
foaf:
homepage
<
https://doi.org/10.1109/NATW49237.2020.9153077
>
dc:
identifier
DBLP conf/natw/AkterKSSP20
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FNATW49237.2020.9153077
(xsd:string)
dcterms:
issued
2020
(xsd:gYear)
rdfs:
label
AI Powered THz VLSI Testing Technology.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/John_Suarez
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Michael_S._Shur
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mustafa_Karabiyik
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Naznin_Akter
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Nezih_Pala
>
swrc:
pages
1-5
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/natw/2020
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/natw/AkterKSSP20/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/natw/AkterKSSP20
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/natw/natw2020.html#AkterKSSP20
>
rdfs:
seeAlso
<
https://doi.org/10.1109/NATW49237.2020.9153077
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/natw
>
dc:
title
AI Powered THz VLSI Testing Technology.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document