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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/natw/AkterKSSP20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_Suarez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_S._Shur>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mustafa_Karabiyik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Naznin_Akter>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nezih_Pala>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FNATW49237.2020.9153077>
foaf:homepage <https://doi.org/10.1109/NATW49237.2020.9153077>
dc:identifier DBLP conf/natw/AkterKSSP20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FNATW49237.2020.9153077 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label AI Powered THz VLSI Testing Technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_Suarez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_S._Shur>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mustafa_Karabiyik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Naznin_Akter>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nezih_Pala>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/natw/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/natw/AkterKSSP20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/natw/AkterKSSP20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/natw/natw2020.html#AkterKSSP20>
rdfs:seeAlso <https://doi.org/10.1109/NATW49237.2020.9153077>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/natw>
dc:title AI Powered THz VLSI Testing Technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document