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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/nccet/SuLWW13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chunming_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jiancheng_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jianfei_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jianwei_Su>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-642-41635-4%5F18>
foaf:homepage <https://doi.org/10.1007/978-3-642-41635-4_18>
dc:identifier DBLP conf/nccet/SuLWW13 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-642-41635-4%5F18 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label Investigation of Reproducibility and Repeatability Issue on EFT Test at IC Level to Microcontrollers. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chunming_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jiancheng_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jianfei_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jianwei_Su>
swrc:pages 171-179 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/nccet/2013>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/nccet/SuLWW13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/nccet/SuLWW13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/nccet/nccet2013.html#SuLWW13>
rdfs:seeAlso <https://doi.org/10.1007/978-3-642-41635-4_18>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/nccet>
dc:title Investigation of Reproducibility and Repeatability Issue on EFT Test at IC Level to Microcontrollers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document