[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/nems/FuYWHHZGLZ15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dacheng_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fang_Yang_0006>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fengshan_Fu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun_He>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Li_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rui_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Taotao_Guan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei_Wang_0087>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xian_Huang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FNEMS.2015.7147499>
foaf:homepage <https://doi.org/10.1109/NEMS.2015.7147499>
dc:identifier DBLP conf/nems/FuYWHHZGLZ15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FNEMS.2015.7147499 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Discussion and analysis of Au/a-Si contact resistance in MEMS/NEMS devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dacheng_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fang_Yang_0006>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fengshan_Fu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun_He>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Li_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rui_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Taotao_Guan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei_Wang_0087>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xian_Huang>
swrc:pages 593-596 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/nems/2015>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/nems/FuYWHHZGLZ15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/nems/FuYWHHZGLZ15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/nems/nems2015.html#FuYWHHZGLZ15>
rdfs:seeAlso <https://doi.org/10.1109/NEMS.2015.7147499>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/nems>
dc:title Discussion and analysis of Au/a-Si contact resistance in MEMS/NEMS devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document