[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/nems/XuW0FMJ13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guanjiang_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Min_Miao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Runiu_Fang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xin_Sun_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yichao_Xu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yufeng_Jin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FNEMS.2013.6559722>
foaf:homepage <https://doi.org/10.1109/NEMS.2013.6559722>
dc:identifier DBLP conf/nems/XuW0FMJ13 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FNEMS.2013.6559722 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label In-line testing of blind TSVs for 3D IC integration and M/NEMS packaging. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guanjiang_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Min_Miao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Runiu_Fang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xin_Sun_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yichao_Xu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yufeng_Jin>
swrc:pages 233-236 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/nems/2013>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/nems/XuW0FMJ13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/nems/XuW0FMJ13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/nems/nems2013.html#XuW0FMJ13>
rdfs:seeAlso <https://doi.org/10.1109/NEMS.2013.6559722>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/nems>
dc:title In-line testing of blind TSVs for 3D IC integration and M/NEMS packaging. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document