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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/newcas/SeghaierT18a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ibtissem_Seghaier>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sofi%E2%88%9A%C2%AEne_Tahar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FNEWCAS.2018.8585623>
foaf:homepage <https://doi.org/10.1109/NEWCAS.2018.8585623>
dc:identifier DBLP conf/newcas/SeghaierT18a (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FNEWCAS.2018.8585623 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Reliability Analysis of CMOS Rambus Oscillator under Device Mismatch Effects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ibtissem_Seghaier>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sofi%E2%88%9A%C2%AEne_Tahar>
swrc:pages 209-212 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/newcas/newcas2018.html#SeghaierT18a>
rdfs:seeAlso <https://doi.org/10.1109/NEWCAS.2018.8585623>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/newcas>
dc:title Reliability Analysis of CMOS Rambus Oscillator under Device Mismatch Effects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document