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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/norcas/HamalainenLH23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Henri_Lunnikivi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roni_H%E2%88%9A%C2%A7m%E2%88%9A%C2%A7l%E2%88%9A%C2%A7inen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Timo_H%E2%88%9A%C2%A7m%E2%88%9A%C2%A7l%E2%88%9A%C2%A7inen_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FNorCAS58970.2023.10305453>
foaf:homepage <https://doi.org/10.1109/NorCAS58970.2023.10305453>
dc:identifier DBLP conf/norcas/HamalainenLH23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FNorCAS58970.2023.10305453 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Memory Mapped I/O Register Test Case Generator for Large Systems-on-Chip. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Henri_Lunnikivi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roni_H%E2%88%9A%C2%A7m%E2%88%9A%C2%A7l%E2%88%9A%C2%A7inen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Timo_H%E2%88%9A%C2%A7m%E2%88%9A%C2%A7l%E2%88%9A%C2%A7inen_0001>
swrc:pages 1-7 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/NorCAS58970.2023.10305453>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/norcas>
dc:title Memory Mapped I/O Register Test Case Generator for Large Systems-on-Chip. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document