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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Somayeh_Hossein_Zadeh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Trond_Ytterdal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FNorCAS51424.2020.9265001>
foaf:homepage <https://doi.org/10.1109/NorCAS51424.2020.9265001>
dc:identifier DBLP conf/norchip/ZadehYA20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FNorCAS51424.2020.9265001 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Comparative Study of Single, Regular and Flip Well Subthreshold SRAMs in 22 nm FDSOI Technology. (xsd:string)
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swrc:pages 1-6 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/NorCAS51424.2020.9265001>
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dc:title Comparative Study of Single, Regular and Flip Well Subthreshold SRAMs in 22 nm FDSOI Technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document