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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/nvmts/BoybatNGRLSE18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abu_Sebastian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bipin_Rajendran>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Evangelos_Eleftheriou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Irem_Boybat>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Manuel_Le_Gallo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._R._Nandakumar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yusuf_Leblebici>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FNVMTS.2018.8603100>
foaf:homepage <https://doi.org/10.1109/NVMTS.2018.8603100>
dc:identifier DBLP conf/nvmts/BoybatNGRLSE18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FNVMTS.2018.8603100 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Impact of conductance drift on multi-PCM synaptic architectures. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abu_Sebastian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bipin_Rajendran>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Evangelos_Eleftheriou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Irem_Boybat>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Manuel_Le_Gallo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._R._Nandakumar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yusuf_Leblebici>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/nvmts/2018>
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/nvmts/BoybatNGRLSE18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/nvmts/nvmts2018.html#BoybatNGRLSE18>
rdfs:seeAlso <https://doi.org/10.1109/NVMTS.2018.8603100>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/nvmts>
dc:title Impact of conductance drift on multi-PCM synaptic architectures. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document