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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/nvmts/PapandreouIPPSS19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haralampos_Pozidis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Milos_Stanisavljevic>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nikolaos_Papandreou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nikolas_Ioannou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Radu_Stoica>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roman_A._Pletka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sasa_Tomic>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_P._Parnell>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FNVMTS47818.2019.8986221>
foaf:homepage <https://doi.org/10.1109/NVMTS47818.2019.8986221>
dc:identifier DBLP conf/nvmts/PapandreouIPPSS19 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FNVMTS47818.2019.8986221 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
rdfs:label Reliability of 3D NAND flash memory with a focus on read voltage calibration from a system aspect. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haralampos_Pozidis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Milos_Stanisavljevic>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nikolaos_Papandreou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nikolas_Ioannou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Radu_Stoica>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roman_A._Pletka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sasa_Tomic>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_P._Parnell>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/nvmts/2019>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/nvmts/PapandreouIPPSS19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/nvmts/PapandreouIPPSS19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/nvmts/nvmts2019.html#PapandreouIPPSS19>
rdfs:seeAlso <https://doi.org/10.1109/NVMTS47818.2019.8986221>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/nvmts>
dc:title Reliability of 3D NAND flash memory with a focus on read voltage calibration from a system aspect. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document