[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/nvmts/Postel-Pellerin19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adnan_Harb>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hassen_Aziza>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hussein_Bazzi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%C2%A9r%E2%88%9A%C2%A9my_Postel-Pellerin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mathieu_Moreau>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pierre_Canet>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vincenzo_Della_Marca>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FNVMTS47818.2019.9043369>
foaf:homepage <https://doi.org/10.1109/NVMTS47818.2019.9043369>
dc:identifier DBLP conf/nvmts/Postel-Pellerin19 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FNVMTS47818.2019.9043369 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
rdfs:label True random number generation exploiting SET voltage variability in resistive RAM memory arrays. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adnan_Harb>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hassen_Aziza>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hussein_Bazzi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%C2%A9r%E2%88%9A%C2%A9my_Postel-Pellerin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mathieu_Moreau>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pierre_Canet>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vincenzo_Della_Marca>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/nvmts/2019>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/nvmts/Postel-Pellerin19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/nvmts/Postel-Pellerin19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/nvmts/nvmts2019.html#Postel-Pellerin19>
rdfs:seeAlso <https://doi.org/10.1109/NVMTS47818.2019.9043369>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/nvmts>
dc:title True random number generation exploiting SET voltage variability in resistive RAM memory arrays. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document