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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/nvmts/TamuraMWKE18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroki_Koike>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/I._Mori>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/N._Watanabe>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ryo_Tamura>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tetsuo_Endoh>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FNVMTS.2018.8603113>
foaf:homepage <https://doi.org/10.1109/NVMTS.2018.8603113>
dc:identifier DBLP conf/nvmts/TamuraMWKE18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FNVMTS.2018.8603113 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Accurate error bit mode analysis of STT-MRAM chip with a novel current measurement module implemented to gigabit class memory test system. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroki_Koike>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/I._Mori>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/N._Watanabe>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ryo_Tamura>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tetsuo_Endoh>
swrc:pages 1-5 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/nvmts/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/nvmts/TamuraMWKE18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/nvmts/TamuraMWKE18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/nvmts/nvmts2018.html#TamuraMWKE18>
rdfs:seeAlso <https://doi.org/10.1109/NVMTS.2018.8603113>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/nvmts>
dc:title Accurate error bit mode analysis of STT-MRAM chip with a novel current measurement module implemented to gigabit class memory test system. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document