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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ofc/GnauschGJKBF19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Armin_Grundmann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_Buttner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thilo_von_Freyhold>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_Juhasz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_Kaden>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tobias_Gnausch>
foaf:homepage <https://ieeexplore.ieee.org/document/8696640>
dc:identifier DBLP conf/ofc/GnauschGJKBF19 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
rdfs:label Novel Opto-Electronical Probe Card for Wafer-Level PIC Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Armin_Grundmann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_Buttner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thilo_von_Freyhold>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_Juhasz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_Kaden>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tobias_Gnausch>
swrc:pages 1-3 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ofc/2019>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ofc/GnauschGJKBF19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ofc/GnauschGJKBF19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ofc/ofc2019.html#GnauschGJKBF19>
rdfs:seeAlso <https://ieeexplore.ieee.org/document/8696640>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ofc>
dc:title Novel Opto-Electronical Probe Card for Wafer-Level PIC Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document