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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/patmos/BernardBVLB14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexandre_Valentian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_Bol>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jean-Didier_Legat>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marc_Belleville>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sebastien_Bernard>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FPATMOS.2014.6951896>
foaf:homepage <https://doi.org/10.1109/PATMOS.2014.6951896>
dc:identifier DBLP conf/patmos/BernardBVLB14 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FPATMOS.2014.6951896 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
rdfs:label Experimental analysis of flip-flops minimum operating voltage in 28nm FDSOI and the impact of back bias and temperature. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexandre_Valentian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_Bol>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jean-Didier_Legat>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marc_Belleville>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sebastien_Bernard>
swrc:pages 1-7 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/patmos/2014>
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/patmos/BernardBVLB14>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/patmos/patmos2014.html#BernardBVLB14>
rdfs:seeAlso <https://doi.org/10.1109/PATMOS.2014.6951896>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/patmos>
dc:title Experimental analysis of flip-flops minimum operating voltage in 28nm FDSOI and the impact of back bias and temperature. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document