[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/patmos/RamleeZ16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mark_Zwolinski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Radi_Husin_Bin_Ramlee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FPATMOS.2016.7833688>
foaf:homepage <https://doi.org/10.1109/PATMOS.2016.7833688>
dc:identifier DBLP conf/patmos/RamleeZ16 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FPATMOS.2016.7833688 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
rdfs:label Using Iddt current degradation to monitor ageing in CMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mark_Zwolinski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Radi_Husin_Bin_Ramlee>
swrc:pages 200-204 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/patmos/2016>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/patmos/RamleeZ16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/patmos/RamleeZ16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/patmos/patmos2016.html#RamleeZ16>
rdfs:seeAlso <https://doi.org/10.1109/PATMOS.2016.7833688>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/patmos>
dc:title Using Iddt current degradation to monitor ageing in CMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document