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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/patmos/RogerSP17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anderson_Pires_Singulani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Frederic_Roger>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jong_Mun_Park>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FPATMOS.2017.8106960>
foaf:homepage <https://doi.org/10.1109/PATMOS.2017.8106960>
dc:identifier DBLP conf/patmos/RogerSP17 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FPATMOS.2017.8106960 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label Optical sensor process variability in a 0.18 őľm high voltage CMOS technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anderson_Pires_Singulani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Frederic_Roger>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jong_Mun_Park>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/patmos/2017>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/patmos/RogerSP17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/patmos/RogerSP17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/patmos/patmos2017.html#RogerSP17>
rdfs:seeAlso <https://doi.org/10.1109/PATMOS.2017.8106960>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/patmos>
dc:title Optical sensor process variability in a 0.18 őľm high voltage CMOS technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document