[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/patmos/WelligZ05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Armin_Wellig>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Julien_Zory>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F11556930%5F50>
foaf:homepage <https://doi.org/10.1007/11556930_50>
dc:identifier DBLP conf/patmos/WelligZ05 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F11556930%5F50 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Static Noise Margin Analysis of Sub-threshold SRAM Cells in Deep Sub-micron Technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Armin_Wellig>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Julien_Zory>
swrc:pages 488-497 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/patmos/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/patmos/WelligZ05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/patmos/WelligZ05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/patmos/patmos2005.html#WelligZ05>
rdfs:seeAlso <https://doi.org/10.1007/11556930_50>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/patmos>
dc:title Static Noise Margin Analysis of Sub-threshold SRAM Cells in Deep Sub-micron Technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document