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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/pdp/GregorettiP95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Claudio_Passerone>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Francesco_Gregoretti>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FEMPDP.1995.389190>
foaf:homepage <https://doi.org/10.1109/EMPDP.1995.389190>
dc:identifier DBLP conf/pdp/GregorettiP95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FEMPDP.1995.389190 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Using a massively parallel architecture for integrated circuits testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Claudio_Passerone>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Francesco_Gregoretti>
swrc:pages 332-338 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/pdp/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/pdp/GregorettiP95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/pdp/GregorettiP95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/pdp/pdp1995.html#GregorettiP95>
rdfs:seeAlso <https://doi.org/10.1109/EMPDP.1995.389190>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/pdp>
dc:subject parallel architectures; integrated circuit testing; image processing; massively parallel architecture; integrated circuits testing; Scanning Electron Microscopy; Integrated Circuits; VLSI integrated circuit; prototype; low level image processing (xsd:string)
dc:title Using a massively parallel architecture for integrated circuits testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document