Conductive Particles Detection in the TFT-LCD Manufacturing Process with U-ResNet.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/prcv/ChenL18
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/prcv/ChenL18
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Eryun_Liu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kangping_Chen
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1007%2F978-3-030-03341-5%5F14
>
foaf:
homepage
<
https://doi.org/10.1007/978-3-030-03341-5_14
>
dc:
identifier
DBLP conf/prcv/ChenL18
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1007%2F978-3-030-03341-5%5F14
(xsd:string)
dcterms:
issued
2018
(xsd:gYear)
rdfs:
label
Conductive Particles Detection in the TFT-LCD Manufacturing Process with U-ResNet.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Eryun_Liu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kangping_Chen
>
swrc:
pages
162-173
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/prcv/2018-4
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/prcv/ChenL18/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/prcv/ChenL18
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/prcv/prcv2018-4.html#ChenL18
>
rdfs:
seeAlso
<
https://doi.org/10.1007/978-3-030-03341-5_14
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/prcv
>
dc:
title
Conductive Particles Detection in the TFT-LCD Manufacturing Process with U-ResNet.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document