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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/prcv/ChenL18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eryun_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kangping_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-030-03341-5%5F14>
foaf:homepage <https://doi.org/10.1007/978-3-030-03341-5_14>
dc:identifier DBLP conf/prcv/ChenL18 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-030-03341-5%5F14 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Conductive Particles Detection in the TFT-LCD Manufacturing Process with U-ResNet. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eryun_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kangping_Chen>
swrc:pages 162-173 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/prcv/2018-4>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/prcv/ChenL18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/prcv/ChenL18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/prcv/prcv2018-4.html#ChenL18>
rdfs:seeAlso <https://doi.org/10.1007/978-3-030-03341-5_14>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/prcv>
dc:title Conductive Particles Detection in the TFT-LCD Manufacturing Process with U-ResNet. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document