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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/prdc/JianDBS013>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nathan_DeBardeleben>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rakesh_Kumar_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sean_Blanchard>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vilas_Sridharan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xun_Jian_0002>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FPRDC.2013.18>
foaf:homepage <https://doi.org/10.1109/PRDC.2013.18>
dc:identifier DBLP conf/prdc/JianDBS013 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FPRDC.2013.18 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label Analyzing Reliability of Memory Sub-systems with Double-Chipkill Detect/Correct. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nathan_DeBardeleben>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rakesh_Kumar_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sean_Blanchard>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vilas_Sridharan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xun_Jian_0002>
swrc:pages 88-97 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/prdc/2013>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/prdc/JianDBS013/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/prdc/JianDBS013>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/prdc/prdc2013.html#JianDBS013>
rdfs:seeAlso <https://doi.org/10.1109/PRDC.2013.18>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/prdc>
dc:title Analyzing Reliability of Memory Sub-systems with Double-Chipkill Detect/Correct. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document