Characterising Soft-Failures in Component-Level ESD Testing. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Patrick_Schrey>
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dc:identifier	DBLP conf/prime/Schrey18 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FPRIME.2018.8430342 (xsd:string)
dcterms:issued	2018 (xsd:gYear)
rdfs:label	Characterising Soft-Failures in Component-Level ESD Testing. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Patrick_Schrey>
swrc:pages	93-96 (xsd:string)
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rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/prime/prime2018.html#Schrey18>
rdfs:seeAlso	<https://doi.org/10.1109/PRIME.2018.8430342>
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dc:title	Characterising Soft-Failures in Component-Level ESD Testing. (xsd:string)
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