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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adalberto_Nobiato_Crespo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M%E2%88%9A%C2%B0rio_Jino>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Paulo_Marcos_Siqueira_Bueno>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F11767718%5F23>
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dc:identifier DBLP conf/profes/BuenoCJ06 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F11767718%5F23 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of CMMI. (xsd:string)
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Paulo_Marcos_Siqueira_Bueno>
swrc:pages 263-277 (xsd:string)
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dc:title Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of CMMI. (xsd:string)
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rdf:type swrc:InProceedings
rdf:type foaf:Document