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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/qrs/WangSDCL22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cong_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haiying_Sun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/HongTao_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hui_Dou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jing_Liu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FQRS57517.2022.00079>
foaf:homepage <https://doi.org/10.1109/QRS57517.2022.00079>
dc:identifier DBLP conf/qrs/WangSDCL22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FQRS57517.2022.00079 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label MC/DC Test Case Automatic Generation for Safety-Critical Systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cong_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haiying_Sun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/HongTao_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hui_Dou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jing_Liu>
swrc:pages 732-743 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/qrs/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/qrs/WangSDCL22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/qrs/WangSDCL22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/qrs/qrs2022.html#WangSDCL22>
rdfs:seeAlso <https://doi.org/10.1109/QRS57517.2022.00079>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/qrs>
dc:title MC/DC Test Case Automatic Generation for Safety-Critical Systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document