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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/retis/RajithaTA15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anjana_Tiwari>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rajitha_Bakthula>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Suneeta_Agarwal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FReTIS.2015.7232878>
foaf:homepage <https://doi.org/10.1109/ReTIS.2015.7232878>
dc:identifier DBLP conf/retis/RajithaTA15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FReTIS.2015.7232878 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label A new local homogeneity analysis method based on pixel intensities for image defect detection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anjana_Tiwari>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rajitha_Bakthula>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Suneeta_Agarwal>
swrc:pages 200-206 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/retis/2015>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/retis/RajithaTA15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/retis/RajithaTA15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/retis/retis2015.html#RajithaTA15>
rdfs:seeAlso <https://doi.org/10.1109/ReTIS.2015.7232878>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/retis>
dc:title A new local homogeneity analysis method based on pixel intensities for image defect detection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document