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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/rfidsec/HolcombRSBF12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Amir_Rahmati>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_E._Holcomb>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kevin_Fu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mastooreh_Salajegheh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wayne_P._Burleson>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-642-36140-1%5F12>
foaf:homepage <https://doi.org/10.1007/978-3-642-36140-1_12>
dc:identifier DBLP conf/rfidsec/HolcombRSBF12 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-642-36140-1%5F12 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
rdfs:label DRV-Fingerprinting: Using Data Retention Voltage of SRAM Cells for Chip Identification. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Amir_Rahmati>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_E._Holcomb>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kevin_Fu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mastooreh_Salajegheh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wayne_P._Burleson>
swrc:pages 165-179 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/rfidsec/2012>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/rfidsec/HolcombRSBF12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/rfidsec/HolcombRSBF12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/rfidsec/rfidsec2012.html#HolcombRSBF12>
rdfs:seeAlso <https://doi.org/10.1007/978-3-642-36140-1_12>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/rfidsec>
dc:title DRV-Fingerprinting: Using Data Retention Voltage of SRAM Cells for Chip Identification. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document