The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Lim_Shi_Xuen>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Mohd_Azraai_Mohd_Razman>
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dc:title	The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation. (xsd:string)
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