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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/rtcsa/AndreiCCZ05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Albert_Mo_Kim_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefan_Andrei>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei-Ngan_Chin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongxin_Zhu_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FRTCSA.2005.87>
foaf:homepage <https://doi.org/10.1109/RTCSA.2005.87>
dc:identifier DBLP conf/rtcsa/AndreiCCZ05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FRTCSA.2005.87 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Runtime-Coordinated Scalable Incremental Checksum Testing of Combinational Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Albert_Mo_Kim_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefan_Andrei>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei-Ngan_Chin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongxin_Zhu_0001>
swrc:pages 357-360 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/rtcsa/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/rtcsa/AndreiCCZ05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/rtcsa/AndreiCCZ05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/rtcsa/rtcsa2005.html#AndreiCCZ05>
rdfs:seeAlso <https://doi.org/10.1109/RTCSA.2005.87>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/rtcsa>
dc:title Runtime-Coordinated Scalable Incremental Checksum Testing of Combinational Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document