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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/sac/CornoRS02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fulvio_Corno>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giovanni_Squillero>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F508791.508908>
foaf:homepage <https://doi.org/10.1145/508791.508908>
dc:identifier DBLP conf/sac/CornoRS02 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F508791.508908 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label An evolutionary algorithm for reducing integrated-circuit test application time. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fulvio_Corno>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giovanni_Squillero>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
swrc:pages 608-612 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/sac/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/sac/CornoRS02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/sac/CornoRS02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/sac/sac2002.html#CornoRS02>
rdfs:seeAlso <https://doi.org/10.1145/508791.508908>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/sac>
dc:subject computer aided design, evolutionary algorithm, full-scan, interleaved-scan, test (xsd:string)
dc:title An evolutionary algorithm for reducing integrated-circuit test application time. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document