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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/sac/SheldonJ04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Frederick_T._Sheldon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kshamta_Jerath>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F967900.968071>
foaf:homepage <https://doi.org/10.1145/967900.968071>
dc:identifier DBLP conf/sac/SheldonJ04 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F967900.968071 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Assessing the effect of failure severity, coincident failures and usage-profiles on the reliability of embedded control systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Frederick_T._Sheldon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kshamta_Jerath>
swrc:pages 826-833 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/sac/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/sac/SheldonJ04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/sac/SheldonJ04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/sac/sac2004.html#SheldonJ04>
rdfs:seeAlso <https://doi.org/10.1145/967900.968071>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/sac>
dc:subject design, measurement, performance, reliability (xsd:string)
dc:title Assessing the effect of failure severity, coincident failures and usage-profiles on the reliability of embedded control systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document