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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/sbcci/CorneliusSSSTS08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Claas_Cornelius>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Di%E2%88%9A%E2%89%A5genes_Cecilio_da_Silva_Jr.>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dirk_Timmermann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Frank_Sill>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hagen_S%E2%88%9A%C2%A7mrow>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jakob_Salzmann>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1404371.1404407>
foaf:homepage <https://doi.org/10.1145/1404371.1404407>
dc:identifier DBLP conf/sbcci/CorneliusSSSTS08 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1404371.1404407 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Encountering gate oxide breakdown with shadow transistors to increase reliability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Claas_Cornelius>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Di%E2%88%9A%E2%89%A5genes_Cecilio_da_Silva_Jr.>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dirk_Timmermann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Frank_Sill>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hagen_S%E2%88%9A%C2%A7mrow>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jakob_Salzmann>
swrc:pages 111-116 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/sbcci/sbcci2008.html#CorneliusSSSTS08>
rdfs:seeAlso <https://doi.org/10.1145/1404371.1404407>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/sbcci>
dc:subject gate oxide breakdown, logic design, modeling, nanotechnology, organic computing, redundancy, transistor (xsd:string)
dc:title Encountering gate oxide breakdown with shadow transistors to increase reliability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document