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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/sbcci/CornoRS02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fulvio_Corno>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giovanni_Squillero>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
foaf:homepage <https://dl.acm.org/doi/10.5555/827246.827387>
dc:identifier DBLP conf/sbcci/CornoRS02 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Reducing Test Application Time through Interleaved Scan. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fulvio_Corno>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giovanni_Squillero>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
swrc:pages 89-94 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/sbcci/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/sbcci/CornoRS02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/sbcci/CornoRS02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/sbcci/sbcci2002.html#CornoRS02>
rdfs:seeAlso <https://dl.acm.org/doi/10.5555/827246.827387>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/sbcci>
dc:title Reducing Test Application Time through Interleaved Scan. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document