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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/sbcci/MarquesBWZBBM23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexandra_L._Zimpeck>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cleiton_Magano_Marques>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cristina_Meinhardt>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fr%E2%88%9A%C2%A9d%E2%88%9A%C2%A9ric_Wrobel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Leonardo_Heitich_Brendler>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Paulo_F._Butzen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Walter_E._Calienes_Bartra>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FSBCCI60457.2023.10261665>
foaf:homepage <https://doi.org/10.1109/SBCCI60457.2023.10261665>
dc:identifier DBLP conf/sbcci/MarquesBWZBBM23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FSBCCI60457.2023.10261665 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexandra_L._Zimpeck>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cleiton_Magano_Marques>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cristina_Meinhardt>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fr%E2%88%9A%C2%A9d%E2%88%9A%C2%A9ric_Wrobel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Leonardo_Heitich_Brendler>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Paulo_F._Butzen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Walter_E._Calienes_Bartra>
swrc:pages 1-6 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/SBCCI60457.2023.10261665>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/sbcci>
dc:title A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document