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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/sbcci/RotheL22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jens_Lienig>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Susann_Rothe>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FSBCCI55532.2022.9893237>
foaf:homepage <https://doi.org/10.1109/SBCCI55532.2022.9893237>
dc:identifier DBLP conf/sbcci/RotheL22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FSBCCI55532.2022.9893237 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Reliability by Design: Avoiding Migration-Induced Failure in IC Interconnects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jens_Lienig>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Susann_Rothe>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/sbcci/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/sbcci/RotheL22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/sbcci/RotheL22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/sbcci/sbcci2022.html#RotheL22>
rdfs:seeAlso <https://doi.org/10.1109/SBCCI55532.2022.9893237>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/sbcci>
dc:title Reliability by Design: Avoiding Migration-Induced Failure in IC Interconnects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document