Twin logic gates: improved logic reliability by redundancy concerning gate oxide breakdown.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/sbcci/SamrowCSTT09
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Twin logic gates: improved logic reliability by redundancy concerning gate oxide breakdown.
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gate oxide breakdown, integrated circuit design, redundant systems, reliability
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Twin logic gates: improved logic reliability by redundancy concerning gate oxide breakdown.
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