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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/sbcci/SamrowCSTT09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andreas_Tockhorn>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Claas_Cornelius>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dirk_Timmermann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Frank_Sill>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hagen_S%E2%88%9A%C2%A7mrow>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1601896.1601960>
foaf:homepage <https://doi.org/10.1145/1601896.1601960>
dc:identifier DBLP conf/sbcci/SamrowCSTT09 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1601896.1601960 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Twin logic gates: improved logic reliability by redundancy concerning gate oxide breakdown. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andreas_Tockhorn>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Claas_Cornelius>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dirk_Timmermann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Frank_Sill>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hagen_S%E2%88%9A%C2%A7mrow>
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/sbcci/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/sbcci/SamrowCSTT09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/sbcci/SamrowCSTT09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/sbcci/sbcci2009.html#SamrowCSTT09>
rdfs:seeAlso <https://doi.org/10.1145/1601896.1601960>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/sbcci>
dc:subject gate oxide breakdown, integrated circuit design, redundant systems, reliability (xsd:string)
dc:title Twin logic gates: improved logic reliability by redundancy concerning gate oxide breakdown. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document