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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/scored/KrohmerSC22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_Krohmer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kunal_Sharma>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shi_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3560835.3564553>
foaf:homepage <https://doi.org/10.1145/3560835.3564553>
dc:identifier DBLP conf/scored/KrohmerSC22 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3560835.3564553 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Adapting Static Taint Analyzers to Software Marketplaces: A Leverage Point for Mass Vulnerability Detection? (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_Krohmer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kunal_Sharma>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shi_Chen>
swrc:pages 73-82 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/scored/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/scored/KrohmerSC22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/scored/KrohmerSC22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/scored/scored2022.html#KrohmerSC22>
rdfs:seeAlso <https://doi.org/10.1145/3560835.3564553>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/scored>
dc:title Adapting Static Taint Analyzers to Software Marketplaces: A Leverage Point for Mass Vulnerability Detection? (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document