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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/scsc/Byrne07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_J._Byrne>
foaf:homepage <https://dl.acm.org/citation.cfm?id=1358003>
dc:identifier DBLP conf/scsc/Byrne07 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label An analysis of semiconductor reticle management using discrete event simulation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_J._Byrne>
swrc:pages 593-600 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/scsc/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/scsc/Byrne07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/scsc/Byrne07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/scsc/scsc2007.html#Byrne07>
rdfs:seeAlso <https://dl.acm.org/citation.cfm?id=1358003>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/scsc>
dc:subject decision support systems, discrete event simulation, photolithography, reticle management (xsd:string)
dc:title An analysis of semiconductor reticle management using discrete event simulation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document