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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/se/NiedermayrR020>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rainer_Niedermayr>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stefan_Wagner_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tobias_R%E2%88%9A%E2%88%82hm>
foaf:homepage <http://dx.doi.org/doi.org%2F10.18420%2FSE2020%5F41>
foaf:homepage <https://doi.org/10.18420/SE2020_41>
dc:identifier DBLP conf/se/NiedermayrR020 (xsd:string)
dc:identifier DOI doi.org%2F10.18420%2FSE2020%5F41 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rainer_Niedermayr>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stefan_Wagner_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tobias_R%E2%88%9A%E2%88%82hm>
swrc:pages 137-138 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/se/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/se/NiedermayrR020/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/se/NiedermayrR020>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/se/se2020.html#NiedermayrR020>
rdfs:seeAlso <https://doi.org/10.18420/SE2020_41>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/se>
dc:title Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document