Automatic Test Pattern Generation. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%E2%88%82rschwin_Fey>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Rolf_Drechsler>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1007%2F11757283%5F2>
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dc:identifier	DBLP conf/sfm/DrechslerF06 (xsd:string)
dc:identifier	DOI doi.org%2F10.1007%2F11757283%5F2 (xsd:string)
dcterms:issued	2006 (xsd:gYear)
rdfs:label	Automatic Test Pattern Generation. (xsd:string)
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swrc:pages	30-55 (xsd:string)
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rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/sfm/sfm2006.html#DrechslerF06>
rdfs:seeAlso	<https://doi.org/10.1007/11757283_2>
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dc:title	Automatic Test Pattern Generation. (xsd:string)
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