[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/sice/FujishimaUYYITC20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Akio_Ito>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Yoshida>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hisato_Yoneda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kenji_Kitayama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kenji_Kumagai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Makoto_Okuda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mitsushiro_Fujishima>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shinichiro_Chino>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shinobu_Ueda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Matsukuma>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Yoshizawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tetsuo_Takeuchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshio_Ono>
foaf:homepage <https://ieeexplore.ieee.org/document/9240274>
dc:identifier DBLP conf/sice/FujishimaUYYITC20 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label A new methodology for providing insight into manufacturing using KPIs based on SMKL (Smart Manufacturing Kaizen Level), utilizing industry standards (OPC UA, FDT, PLCopen and AutomationML). (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Akio_Ito>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Yoshida>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hisato_Yoneda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kenji_Kitayama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kenji_Kumagai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Makoto_Okuda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mitsushiro_Fujishima>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shinichiro_Chino>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shinobu_Ueda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Matsukuma>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Yoshizawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tetsuo_Takeuchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshio_Ono>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/sice/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/sice/FujishimaUYYITC20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/sice/FujishimaUYYITC20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/sice/sice2020.html#FujishimaUYYITC20>
rdfs:seeAlso <https://ieeexplore.ieee.org/document/9240274>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/sice>
dc:title A new methodology for providing insight into manufacturing using KPIs based on SMKL (Smart Manufacturing Kaizen Level), utilizing industry standards (OPC UA, FDT, PLCopen and AutomationML). (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document