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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/sies/ZobelW07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Weyand>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dieter_Z%E2%88%9A%E2%88%82bel>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FSIES.2007.4297312>
foaf:homepage <https://doi.org/10.1109/SIES.2007.4297312>
dc:identifier DBLP conf/sies/ZobelW07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FSIES.2007.4297312 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label Augmenting sensitivity analysis for embedded applications by program level derivation of process parameters. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Weyand>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dieter_Z%E2%88%9A%E2%88%82bel>
swrc:pages 17-24 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/sies/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/sies/ZobelW07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/sies/ZobelW07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/sies/sies2007.html#ZobelW07>
rdfs:seeAlso <https://doi.org/10.1109/SIES.2007.4297312>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/sies>
dc:title Augmenting sensitivity analysis for embedded applications by program level derivation of process parameters. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document