| Property | Value |
|---|
|
dcterms:bibliographicCitation
|
<http://dblp.uni-trier.de/rec/bibtex/conf/sigmetrics/1982>
|
|
dc:creator
|
<https://dblp.l3s.de/d2r/resource/authors/Edward_D._Lazowska>
|
|
swrc:editor
|
<https://dblp.l3s.de/d2r/resource/authors/Edward_D._Lazowska>
|
|
foaf:homepage
|
<http://dx.doi.org/doi.org%2F10.1145%2F1035293>
|
|
foaf:homepage
|
<https://doi.org/10.1145/1035293>
|
|
dc:identifier
|
DBLP conf/sigmetrics/1982
(xsd:string)
|
|
dc:identifier
|
DOI doi.org%2F10.1145%2F1035293
(xsd:string)
|
|
dc:identifier
|
ISBN 978-0-89791-079-8
(xsd:string)
|
|
swrc:isbn
|
ISBN 978-0-89791-079-8
(xsd:string)
|
|
dcterms:issued
|
1982
(xsd:gYear)
|
|
rdfs:label
|
Proceedings of the 1982 ACM SIGMETRICS conference on Measurement and modeling of computer systems, SIGMETRICS 1982, Seattle, Washington, USA, August 30 - September 1, 1982
(xsd:string)
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/AgrawalB82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/AgreT82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/Babaoglu82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/BaccelliC82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/Bard82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/Blake82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/BolzoniCMS82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/Brandwajn82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/BrumfieldD82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/BuntHP82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/EagerS82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/Gelenbe82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/GelenbeM82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/HagmannF82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/HarbitterT82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/Haring82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/HercksenKKK82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/HodgesS82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/KingM82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/LazowskaZ82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/MarieSS82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/McDaniel82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/NeuseC82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/Plateau82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/SmithL82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/TripathiH82>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/journals/sigmetrics/Wu82>
|
|
dc:publisher
|
ACM
(xsd:string)
|
|
owl:sameAs
|
<http://bibsonomy.org/uri/bibtexkey/conf/sigmetrics/1982/dblp>
|
|
owl:sameAs
|
<http://dblp.rkbexplorer.com/id/conf/sigmetrics/1982>
|
|
owl:sameAs
|
<urn:isbn:978-0-89791-079-8>
|
|
rdfs:seeAlso
|
<http://amazon.com/s/ref=nb_ss_gw?field-keywords=978-0-89791-079-8>
|
|
rdfs:seeAlso
|
<https://doi.org/10.1145/1035293>
|
|
swrc:series
|
<https://dblp.l3s.de/d2r/resource/conferences/sigmetrics>
|
|
dcterms:tableOfContent
|
<http://dblp.uni-trier.de/db/conf/sigmetrics/sigmetrics82.html>
|
|
dc:title
|
Proceedings of the 1982 ACM SIGMETRICS conference on Measurement and modeling of computer systems, SIGMETRICS 1982, Seattle, Washington, USA, August 30 - September 1, 1982
(xsd:string)
|
|
dc:type
|
<http://purl.org/dc/dcmitype/Collection>
|
|
rdf:type
|
swrc:Proceedings
|
|
rdf:type
|
foaf:Document
|
![[RDF data]](https://dblp.l3s.de/d2r/snorql/rdf_flyer.24.gif)