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<https://dblp.l3s.de/d2r/resource/authors/Richard_R._Muntz>
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dc:creator
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<https://dblp.l3s.de/d2r/resource/authors/Susan_S._Owicki>
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swrc:editor
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<https://dblp.l3s.de/d2r/resource/authors/Richard_R._Muntz>
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swrc:editor
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<https://dblp.l3s.de/d2r/resource/authors/Susan_S._Owicki>
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foaf:homepage
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<http://dx.doi.org/doi.org%2F10.1145%2F166955>
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foaf:homepage
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<https://doi.org/10.1145/166955>
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dc:identifier
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DBLP conf/sigmetrics/1993
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dc:identifier
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DOI doi.org%2F10.1145%2F166955
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dc:identifier
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ISBN 0-89791-580-1
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swrc:isbn
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ISBN 0-89791-580-1
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dcterms:issued
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1993
(xsd:gYear)
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rdfs:label
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Proceedings of the 1993 ACM SIGMETRICS conference on Measurement and modeling of computer systems, Santa Clara, California, USA, May 10-14, 1993
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<http://dblp.uni-trier.de/db/conf/sigmetrics/sigmetrics93.html>
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dc:title
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Proceedings of the 1993 ACM SIGMETRICS conference on Measurement and modeling of computer systems, Santa Clara, California, USA, May 10-14, 1993
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swrc:Proceedings
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